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FT-I04 Femto-Indenter
The FT-I04 Femto-Indenter is a high-resolution nanomechanical testing system capable of accurately quantifying the mechanical and tribological properties of materials at the micro- and nanoscale.

제품설명

Description 


FT-I04 Femto-Indenter Brochure (PDF)  


The FT-I04 Femto-Indenter  is a high-resolution nanomechanical testing system capable of accurately quantifying the mechanical and tribological properties of materials at the micro- and nanoscale. 

As the world’s first MEMS-based nanoindenter, the FT-I04 uses the patented FemtoTools Micro-Electro-Mechanical System (MEMS) technology. Leveraging over two decades of innovations, this nanoindenter features unmatched resolution, repeatability and dynamic stability.

The FT-I04 Femto-Indenter is optimized for the mechanical testing of metals, ceramics, thin films and coatings, as well as more compliant microstructures such as metamaterials. Furthermore, the FT-I04 is modular and can extend its capabilities to accommodate the versatile requirements of various research fields.


Typical applications include the quantification of hardness and elastic modulus as a function of indentation depth using the integrated continuous stiffness measurement (CSM) mode, as well as the high-resolution mapping of mechanical properties. Furthermore, optional modules enable scratch and wear testing, high-resolution scanning probe microscopy (SPM) imaging and high temperature testing (coming soon). 


With unmatched noise floors down to 500 pN in force (guaranteed real world values) and 50 pm in displacement (guaranteed real world values) and comparatively large ranges of 200 mN and 20 μm, the Femto-Indenter enables the comprehensive study of mechanical behavior of materials with an unprecedented accuracy and repeatability.





SYSTEM COMPONENTS 




Measurement head (interchangeable) consisting of: 

• Long-range positioner for the fast and accurate approach of the nanoindentation tip to the sample surface over a range of 40 mm with a position sensing resolution of 1 nm 

• Piezo-scanner for the high-resolution, position-controlled nanomechanical testing of the material properties of the sample. It features a range of 20 µm and a guaranteed noise floor smaller than 50 pm 

• FT-S Micro-Force Sensing Probe (interchangeable) with various tip geometry and materials options, enabling the measurement of forces up to 200 mN (FT-S200’000) and down to 500 pN (guaranteed noise floor of the FT-S200) 

2-axis sample stage for the accurate positioning of the sample under either the microscope or the nanoindenter head. The stage provides a travel range of 130 x 130 mm and features a closed-loop position control with a noise floor of 1 nm 

Interchangeable sample tray for up to 6 samples and 1 reference fused silica specimen 

④ High-stiffness granite measurement frame 

 High-resolution, top-down optical microscope with coaxial illumination for the observation of the sample and the easy selection of the indentation locations 

⑥ Enclosure for acoustic shielding and environmental control

Features

High-resolution nanoindentation with an unmatched repeatability to detect the smallest variation in hardness and modulus 

Intrinsic position-controlled measurements, enabling the direct recording and quantification of fast plasticity and fracture events (optionally, force-controlled measurements are possible as well)

Displacement sensing range of 20 µm with a guaranteed noise floor of less than 50 pm (in fine mode) and up to 40 mm with a 1 nm noise floor (in coarse mode), covering 9 orders of magnitude

Interchangeable force sensing probes with various tip geometries and materials enabling force-sensing from 500 pN to 200 mN in both tension and compression, covering 9 orders of magnitude

Stiffest nanoindenter on the market with the highest dynamic range featuring load cells with a resonance frequency up to 50 kHz and a data acquisition rate of 96 kHz

SPM imaging of surfaces, scratches and residual indents enabling the quantification of surface damage and deformation such as pile-up or sink-in (coming soon)

High-resolution nano-scratch, nano-wear and nanofriction measurement using the optional Scratch Testing Module in combination with the 2-axis Microforce Sensing Probe

Integrated procedures for fast and accurate calibration of the nanoindenter tip geometry (area function calibration) from ultra-shallow depths to conventional nanoindentations

Extensive data analysis tools for the plotting of data, its analysis using customizable fits and functions, and the extraction and visualization of material properties


Specifications


Force Sensing

- Maximum force : 200 mN

- Force noise floor : 0.5 nN (at 10Hz)

- Digital resolutions : 0.5 pN

- Measurement frequency up to 96 kHz


Displacement Sensing (coarse)

- Displacement range : 40 mm

- Displacement noise floor : 1 nm (at 10 Hz)

- Measurement frequency : 50 Hz


Displacement Sensing (fine)

- Displacement range : 20 µm

- Displacement noise floor : 0.05 nm (at 10 Hz)

- Digital resolution : 0.05 pm

- Measurement frequency up to 96 kHz


Sample Stage

- Range : 130 x 130 mm

- Noise floor (10 Hz) : 1nm


Microscope

- Camera : 5 megapixel CMOS sensor

- Objective lens options : 5x, 10x, 20x, 50x, 100x

- Focus : motorized

- Coaxial illumination : LED, Adjustable 


Typical Application


NanoIndetation




- Simple nanoindentation (ISO 14577)


- Real continuous stiffness measurement (CSM) based nanoindentation


Scratch Testing




- Measure of critical load for thin films and coatings failure


- Determine cohesive and adhesive failure of thin films


- Measurement of tribological surface properties


High-Sensitivity Property Mapping




- Mapping of modulus and harness over an area (3D mapping)


- Depth-dependent mapping of modulus and hardness (4D mapping)


- Fast mapping, in both cases down to less than 1 s/indent


Wear Testing




- Quantification of the rate of materials wear


- Measurement of the materials friction coefficient


SPM Imaging




- 3D imaging of surface roughness and topography


- Direct measurement and visualization of indents to quantify pile-ups and residual deformation


- 3D visualization of scratch and wear profiles


 

 

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