나노비즈코리아

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C-flat Grids

C-flat Grids (Holey Carbon and Gold Grids for Cryo-TEM)
Holey thin film coatings perfectly suited for Cryo-EM.

제품설명

Product Catalog


Browse through all available TEM thin sample supports to find the ones that best suit your needs.


⤓ View Ordering Guide Download (PDF)


☞  저희 나노비즈 코리아는 C-FLAT 제조사인 Protochips로 부터 단독으로 공급 받고 있습니다. 

       따라서, 좋은 가격 빠른 딜리버리로 Grids를 공급할 수 있습니다.
       많은 견적 및 문의 요청해주십시오.


 

Holey Film TEM Grids are defined by 6 parameters:



 

· Hole diameter : range of sizes from 1.2 ㎛ to 8 

· Hole spacing range of sizes from 1 ㎛ and 4  

· Film material: range of sizes from 1 ㎛ and 4  

· Grid material: Copper, Gold 

· Grid mesh size: 200, 300, 400 

· Film thickness: 20 nm and 40 nm 


     



C-FLAT : The Ultar-flat holey carbon grid perfectly suited for cryo-EM. With 54 varieties, there is always a C-flat™ product optimized for you needs.


Au-Flat : Improve your image quality and resolution with the gold alloy film of Au-Flat, which reduces particle movement during imaing


CD-Flat : The premier holey carbon sample support for automated S/TEM imaging and metroolgy.



NEW! Au-FLAT!


A unique gold foil sample support with superior stability for Cryo-EM



 

· Better Datasets

· Durable                                                                                                                   

· Biocompatible 

· Prevent Mistakes    

· Fast Delivery 


⤓ View Au-Flat FAQs Download (PDF) 


 

Applications


C-Flat and Au-Flat provide the ideal specimen support to achieve high-resolution data, making it the perfect choice for single particle analysis and cryo-tomography


CD-Flat is the premier holey carbon sample support for automated S/TEM imaging and mertrology


  


Cryo Electron Microscopy : Researchers report that the ultra-flat surface of C-flat leads to thin ice and uniform particle distribution, enabling superior data collection compared to other support films.


CD-TEM : Measuring critical dimensions of transistor gate structures and other semiconductor thin film require TEM-based metrology. C-Flat provides a regular array of analysis sites covered with a thin, amorphous sample support, features that are required for automated CD-TEM characterization.



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