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NanoBiz Korea
나노비즈코리아
agar scientific
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SEM Specimen Stubs
Amray, Cambridge Analysis, Cambridge, Deben, FEI-ESEM, Hitachi, ISI/ABT/Topcon, JEOL, LEO/Cambridge, FEI/Philips, Camscan, TESCAN, Zeiss and LEO/Zeiss.
제품설명
SEM Specimen Stubs, 12.5mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. AGG301, AGG301B and AGG301C.
제품 |
제품 코드번호 |
Aluminium pin stubs. Pack of 100 |
AGG301 |
Brass pin stubs. Pack of 10 |
AGG301B |
Copper pin stubs. Pack of 10 |
AGG301C |
SEM Specimen Stubs, 25mm dia, 3.2 x 8mm pin
SEM Specimen Stubs for LEO/CAMBRIDGE, FEI/PHILIPS, CAMSCAN, TESCAN, ZEISS instruments. 25mm dia, pin length 3.2 x 8mm.
제품 | 제품 코드번호 |
Aluminium pin stubs, 25 mm dia. Pack of 50 | AGG399 |
Brass pin stubs, 25 mm dia. Pack of 10 | AGG399B |
SEM Specimen Stubs - Short Pin 12.5mm dia, 3.2 x 6mm
SEM Specimen Stubs for LEO/ZEISS instruments. 12.5mm dia, pin length 6mm.
제품 | 제품 코드번호 |
SEM Specimen Stubs, Aluminium, 12.5mm dia, 3.2 x 6mm pin (Pk of 100) | AGG301F |
SEM Specimen Stubs, Brass, 12.5mm dia, 3.2 x 6mm pin (Pk of 100) | AGG301F-B |
